Basic Properties:
| Melting Point (°C) | 1598 | Density (g/cm3) | 7.9 |
| Hygroscopic | None | Hardness (ns) | 4~4.5 |
| Wavelength of Emission Max. (nm) | 475 | Refractive Index @ Emission Max | 2.2~2.3 |
| Decay Time (ns) | 14000 | Light Yield (photons/MeV) | 12000~15000 |
| Photoelectron Yield (% of NaI(Tl)) (for γ-rays) | 30~50 | Afterglow(%@3ms) | <0.1 |
| Radiation Length(cm) | 1.06 | ||
Specifications and Abilities:
| Growth Method | Bridgman | Maximum Dimension | ∅ 80 mm x 200 mm |
| Available Items | Single crystal and 1D array or 2D array | Inhomogeneity between pixels in array | <15% |
CdWO4-Cadmium tungstate scintillation crystal is characterized by high density, high atomic number and relatively high light yield with extremely low decay time. When subjected to x-ray irradiation, the after-glow of CdWO4 is very slow typically less than 0.1% at 3ms, and CdWO4 scintillators also demonstrate very good resistance to radiation. All of these features are significant and make CdWO4 a primary scintillation crystal for x-ray Computerized Tomography (CT) and X-ray security scanning inspection.
Hangzhou Shalom EO offers the custom CdWO4 crystals and CdWO4 arrays upon customer's request, the linear or one-dimension (1D) and two-dimension (2D) arrays are available, and the CdWO4 scintillation array integrated with Photodiode (PD) assemblies are also offered.
Applications
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