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  • CdWO4 Scintillators
  • CdWO4 Scintillators

CdWO4 Scintillators

  • low after-glow
  • High density, high-Z scintillator
  • Relatively high light yield
  • Withstands high energy radiation damage
  • Suitable for low activity counting application

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Basic Properties:

Melting Point (°C) 1598 Density (g/cm3) 7.9
Hygroscopic None Hardness (ns) 4~4.5
Wavelength of Emission Max. (nm) 475 Refractive Index @ Emission Max 2.2~2.3
Decay Time (ns) 14000 Light Yield (photons/MeV) 12000~15000
Photoelectron Yield (% of NaI(Tl)) (for γ-rays) 30~50 Afterglow(%@3ms) <0.1
Radiation Length(cm) 1.06



Growth Method Bridgman Maximum Dimension ∅ 80 mm x 200 mm
Available Items Single crystal and 1D array or 2D array Inhomogeneity between pixels in array <15%

CdWO4 crystal is characterized by high density, high atomic number and relatively high light yield with extremely low decay time.When subjected to x-ray irradiation, the after-glow of CdWO4 is very slow typically less than 0.1% after 3ms, and demonstrate very good resistance. All of these features are significant and make CdWO4 a primary scintillation crystal for x-ray CT and in security inspection.


  1. Growth method: Bridgman
  2. Maximum dimension: ∅ 80 mm x 200 mm
  3. Available items: single crystal and 1D array or 2D array
  4. Inhomogeneity between pixels in array: <15%

Application Notes:

  • Security inspection
  • X-ray CT
  • High energy physics
  • Nuclear medicine