Basic Properties:
| Melting Point (°C) | 1598 | Density (g/cm3) | 7.9 |
| Hygroscopic | None | Hardness (ns) | 4~4.5 |
| Wavelength of Emission Max. (nm) | 475 | Refractive Index @ Emission Max | 2.2~2.3 |
| Decay Time (ns) | 14000 | Light Yield (photons/MeV) | 12000~15000 |
| Photoelectron Yield (% of NaI(Tl)) (for γ-rays) | 30~50 | Afterglow(%@3ms) | <0.1 |
| Radiation Length(cm) | 1.06 | ||
Specifications and Abilities:
| Growth Method | Bridgman | Maximum Dimension | ∅ 80 mm x 200 mm |
| Available Items | Single crystal and 1D array or 2D array | Inhomogeneity between pixels in array | <15% |
CdWO4-Cadmium tungstate scintillation crystal is characterized by high density, high atomic number, and relatively high light yield with meager decay time. When subjected to x-ray irradiation, the after-glow of CdWO4 is very slow, typically less than 0.1% at 3ms, and CdWO4 scintillators also demonstrate excellent resistance to radiation. These significant features make CdWO4 a primary scintillation crystal for X-ray computerized Tomography (CT) and X-ray security scanning inspection.
Hangzhou Shalom EO offers the custom CdWO4 crystals upon customers' requests. Linear one-dimensional and two-dimension CdWO4 Scintillation Arrays are also available. The latter might even be coupled with silicon photodiodes if you require it.
Applications
