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  • CZT (CdZnTe) Substrates
  • CZT (CdZnTe) Substrates

CZT (CdZnTe) Substrates


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Specifications:

Materials Cd1-xZnxTe,x=0.04 Type p-type
Size(mm3) 14×14×1.3, 10×10×1  Index of Crystal Face (111), (211)
Orientation and Accuracy Low index surface orientation, Orientation Accuracy ≤0.3° Resistivity ρ>106 Ω·cm
IR Transmission% ≥60% Infrared Imaging Te inclusions≤ 2μm 
or Cd inclusions≤2μm 
X-ray DCRC FWHM(FWHM) ≤30 rad·s Average Etch Pit density(EPD) 1x104/cm2 ~ 5x104/cm2
Surfaces Roughness Ra≤5 nm Packaging 1000 class clean room,  vacuum packaging
Storage Temperature 22 ℃ ~ 25 ℃ Storage Humidity 45% ~ 60%

The Cd0.96Zn0.04Te (CZT) is the preferred material using as a substrate, mainly due to its similar lattice constant to HgCdTe (MCT), transparency to infrared (IR) wave lengths to be detected by the MCT layer, as well as the excellent electrical properties, high absorption coefficient and moderate thermal expansion.