Orientation | (100) 0°±0.5°, (100) 2°±0.5°off toward <111>A, (100)15°±0.5°off toward <111>A |
Size(mm) | 25×25×0.3, 10×10×0.35, 10×5×0.35, 5×5×0.35 |
Polishing | SSP (single surface polished) or DSP (double surface polished) |
Surface Roughness | ≤0.5nm |
Basic Properties:
Growth Method | VGF/ HB | Crystal Structure | Zinc Blende |
Appearance | Very dark red, vitreous crystals | Density | 5.3176 g/cm3 |
Lattice Constant | 5.65×10-10m | Molar Mass | 144.645 g•mol-1 |
Band Gap@300 K | 1.424eV | Electron Mobility @300K | 8500 cm2/(V×s) |
Thermal Conductivity@300K | 0.55 W/(cm×K) | Chemical Stability | Insoluble in water, ethanol, methanol, and acetone. Soluble in HCl. |
Refractive Index | 3.3 |
Single Crystal | Doping | Conduction Type | Carrier Concentration | Dislocation Density |
GaAs | Si | No | >5×1017 cm-3 | <5×105 cm-2 |
Gallium Arsenide (GaAs) Crystal is a crystalline compound of the elements gallium and arsenic. It is a III-V direct bandgap semiconductor with a Zinc blende crystal structure.
The fundamental function of GaAs wafers is to be used as a substrate material for the epitaxial thin film growth of other III-V semiconductors including indium gallium arsenide, aluminum gallium arsenide, etc. This kind of substrate has good performance under high frequencies, high temperature and low temperature, low noise, high radiation tolerance, and higher electron mobility than silicon which makes them suitable for high-frequency applications like radio frequency (RF) and microwave devices. In addition, GaAs have a direct bandgap, enabling efficient emission and absorption of light, making it ideal for optoelectronic devices like high-density p-i-n detectors and laser diodes with robust silicon electronic integrated circuits.
Hangzhou Shalom EO offers custom GaAs crystals, wafers, and substrates, which are suitable for the application of epitaxial growth, microwave, IR LED, laser diodes, solar cells, and infrared optical windows.