|Size(mm3)||14×14×1.3, 10×10×1||Index of Crystal Face||(111), (211)|
|Orientation and Accuracy||Low index surface orientation, Orientation Accuracy ≤0.3°||Resistivity||ρ＞106 Ω·cm|
|IR Transmission%||≥60%||Infrared Imaging||Te inclusions≤ 2μm
or Cd inclusions≤2μm
|X-ray DCRC FWHM(FWHM)||≤30 rad·s||Average Etch Pit density(EPD)||1x104/cm2 ~ 5x104/cm2|
|Surfaces Roughness||Ra≤0.5 nm||Packaging||1000 class clean room, vacuum packaging|
|Storage Temperature||22 ℃ ~ 25 ℃||Storage Humidity||45% ~ 60%|
Cadmium Zinc Telluride (CZT /CdZnTe) Substrates is a multifunctional material with excellent electrical properties, high absorption coefficient and moderate thermal expansion. As a direct bandgap semiconductor, it is used in a variety of applications, including semiconductor radiation detectors, photorefractive gratings, electro-optic modulators, solar cells, and terahertz generation and detection.Also,Radiation detectors using CZT can operate in direct-conversion (or photoconductive) mode at room temperature, unlike some other materials (particularly germanium) which require liquid nitrogen cooling
Due to its similar lattice constant to HgCdTe (MCT),CdZnTe (CZT) has been traditionally used as substrate for HgCdTe (MCT) epitaxy. And owing to its transparency to infrared (IR) wave lengths to be detected by the MCT epilayer, despite the difficulties in growing large area of affordable high-quality substrates,CZT wafers remain the best choice for high yield infrared devices. Infrared devices based on CZT substrates continue to be the cutting-edge choices in the market in terms of sensitivity and reliability.
Hangzhou Shalom EO offers the cutom CZT substrate and wafers according to customer's request, with good surface roughness less than 0.5nm and clean package of 1000 grade clean room and 100 grade bags.